C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing
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C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing
With one-click testing for various semiconductor power devices and integrated support for significant measurement characteristics, the TH511 is an essential tool for efficient production line testing.
C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing
物品 #: 195744555

C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing

物品 #: 195744555

HKD 253791

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*All items will import from 美國

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現在訂購，約可在下列時間收貨： 星期二, 十月 13
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With one-click testing for various semiconductor power devices and integrated support for significant measurement characteristics, the TH511 is an essential tool for efficient production line testing.
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Note: Step Down Voltage Transformer required for using electronics products of 美國 store (110-120). Recommended power converters 立即購買.

What Stands Out

Dual Channel Testing
Simultaneously analyze two devices, enhancing productivity and efficiency in diode and transistor testing, making it ideal for high-demand laboratories.
Wide Frequency Range
Operates effectively from 1kHz to 2MHz, allowing accurate characterization of semiconductor devices across a broad frequency spectrum, surpassing many competitors.
User-Friendly Interface
Designed with an intuitive interface to streamline testing procedures, reducing user errors and facilitating quicker data analyses, thus providing excellent value for both beginners and experienced professionals.

產品詳情

Shop C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing online at a best price in 香港. B0FD2X4RHJ
Power SourceAc
Lower Temperature Rating32 u00b0C
Minimum Operating Voltage100 volts
Upper Temperature Rating140 u00b0C
Measurement TypeVoltage
Maximum Operating Voltage1000 volts
Style NameDigital
ColorBlack
Item Weight33 pounds (14.97 kg)
Item Dimensions6.97 x 15.94 x 16.93 inches (17.7 x 40.5 x 43 cm)
Brand NameYITRANIC
ModelCv2000
ManufacturerYITRANIC
Included ComponentsC-V Analyzer, PIV testing fixture, Cable
Part NumberCv2000
Specification MetIec 61010
BrandYITRANIC
StyleDigital

Who Should Buy?

Suitable For
  • Semiconductor Researchers

    Ideal for researchers analyzing semiconductor properties and developing advanced materials for electronic applications.

  • Quality Control Engineers

    Perfect for engineers in quality control to ensure semiconductor devices meet performance specifications and standards.

  • Electronics Educators

    Excellent tool for educators in electronics programs to teach students about semiconductor behavior and testing methods.

Not Suitable For
  • Casual Hobbyists

    Not suitable for casual users or hobbyists without advanced knowledge of semiconductor testing and interpretation.

產品敘述

C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing

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客戶問題與解答

  • 題: What types of devices can the TH511 analyze?

    回答: It can analyze diodes, transistors, MOSFETs, and IGBTs.
  • 題: What is the testing frequency range of the TH511?

    回答: The testing frequency range is 1kHz to 2MHz.
  • 題: Can the TH511 support parallel testing?

    回答: Yes, the TH511 supports parallel testing of up to 6 discrete devices or modules simultaneously.

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“Good product, and smooth delivery!”

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HKD 253791

現在訂購，約可在下列時間收貨： 星期二, 十月 13

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特色和優勢

  • Integrated design allows for one-click testing of parasitic capacitance and C-V characteristics.
  • Capable of testing diodes, transistors, MOSFETs, and IGBTs without frequent cable adjustments.
  • Supports rapid testing and automated integration, ideal for production lines.
  • C-V curve scanning meets R&D and characterization needs in laboratory settings.
  • Features a large 10.1-inch display for instant analysis and simultaneous data viewing.
  • Parallel testing of up to 6 devices streamlines testing processes.

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