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Debug Automation from Pre-Silicon to Post-Silicon
物品 #: 150088934

Debug Automation from Pre-Silicon to Post-Silicon

物品 #: 150088934

HKD 431

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Shop Debug Automation from Pre-Silicon to Post-Silicon online at a best price in 香港. B00RZHHMYI
  • This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Publisher Springer
Publication date September 25, 2014
Edition 2015th
Language English
File size 7.0 MB
Enhanced typesetting Enabled
X-Ray Not Enabled
Word Wise Not Enabled
Print length 186 pages
ISBN-13 978-3319093093
Page Flip Enabled
Item Weight0.5 lbs (230 grams)

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Debug Automation from Pre-Silicon to Post-Silicon

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