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物品 #:
21176075
Semiconductor Material and Device Characterization (IEEE Press)
85% of respondents would recommend this to a friend
物品 #:
21176075
HKD 1776
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產品詳情
- This Third Edition updates a landmark text with the latest findingsThe Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:Updated and revised figures and examples reflecting the most current data and information260 new references offering access to the latest research and discussions in specialized topicsNew problems and review questions at the end of each chapter to test readers' understanding of the materialIn addition, readers will find fully updated and revised sections in each chapter.Plus, two new chapters have been added:Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
| Publisher | Wiley-IEEE Press |
| Publication date | June 29, 2015 |
| Edition | 3rd |
| Language | English |
| Print length | 800 pages |
| ISBN-10 | 0471739065 |
| ISBN-13 | 978-0471739067 |
| Item Weight | 2.11 pounds (960 grams) |
| Dimensions | 6.4 x 2 x 9.4 inches (16.3 x 5.1 x 23.9 cm) |
產品敘述
Semiconductor Material and Device Characterization (IEEE Press)
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Semiconductors Editorial Review
"Semiconductor Material and Device Characterization" is a highly recommended reference book for professionals working in the field of semiconductor material and device. It is an incredible resource for engineers and materials scientists in need of a comprehensive guide. The book assumes a working knowledge of semiconductor physics, which is essential for getting the most out of the text. It is well-referenced and provides a thorough explanation of the principles behind various characterization techniques. Additionally, the book includes original references for those seeking more detailed information. Although primarily targeted at lab use, many readers have found this book valuable enough to include it in their personal libraries. Overall, "Semiconductor Material and Device Characterization" is Considered a must-have resource for anyone working in the semiconductor field.
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優點
- Comprehensive and detailed guide for semiconductor material and device characterization
- Well-referenced with explanations of underlying principles
- Valuable resource for professionals in the field
缺點
- Assumes a working knowledge of semiconductor physics, which may be challenging for beginners
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